A2LA Scope of Accreditation & Certifications
All American Scales & Calibration's laboratory is accredited by A2LA to ISO/IEC 17025:2017 and ANSI/NCSL Z540-1-1994. Our Scope of Accreditation lists exactly which calibrations are covered, the ranges, and our best measurement uncertainty (CMC) for each.
- Accrediting body: A2LA (American Association for Laboratory Accreditation)
- Certificate number: 1848.01
- Standards: ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994
- Valid to: August 31, 2027
- Scope last revised: September 11, 2025
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Chemical
| Parameter/Equipment | Range | CMC2, 4 (±) | Comments |
|---|---|---|---|
| pH Meter – Fixed Points3 | 4 pH | 0.12 pH | Method: ACP-071; pH buffer solutions |
| 7 pH | 0.12 pH | ||
| 10 pH | 0.12 pH | ||
| Conductivity – Fixed Points | (0 to 1) μS | 4.8 % | Method: ACP-071; conductivity standards |
| (1 to 10) μS | 1.2 % | ||
| (10 to 100) μS | 1.0 % | ||
| (100 to 1000) μS | 0.6 % | ||
| (1000 to 10 000) μS | 0.6 % | ||
| (10 000 to 100 000) μS | 0.5 % |
Notes from the A2LA scope:
- 2 CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
- 3 Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
- 4 Percentages are percentage of reading unless otherwise indicated. L = nominal length in inches, D = nominal diameter in inches, I.V. = Indicated Value.
Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.
Dimensional
| Parameter/Equipment | Range4 | CMC2, 4 (±) | Comments |
|---|---|---|---|
| Gage Blocks | Up to 4 in | (1.6 + 2L) μin | Method: ACP-023; by mechanical comparison UMM DMS680, Pratt & Whitney 1000M |
| (5 to 20) in | (19 + 0.8L) μin | ||
| Length Bars | Up to 80 in | (18 + 2.2L) μin | Method: ACP-010; by UMM, Pratt & Whitney 1000M |
| Plug Gages (OD) | Up to 12 in | (17 + 3.9D) μin | Method: ACP-024; UMM, DMS 680, Pratt & Whitney 1000M |
| Taper | (0.039 to 5.7) in | 5 μin | IAC Masterscanner |
| Diameter | (0.039 to 5.7) in | (80 + 2L) μin | IAC Masterscanner |
| Taper Pipe Thread Plugs Effective Pitch Diameter |
(0.039 to 5.7) in | (80 + 5L) μin | Method: ACP-025; IAC Masterscanner |
| Simple Pitch Diameter | (0.039 to 5.7) in | (80 + 5L) μin | |
| Major Diameter | (0.039 to 5.7) in | (80 + 5L) μin | |
| Minor Diameter | (0.039 to 5.7) in | (100 + 5L) μin | |
| Thread Pitch | (0.039 to 5.7) in | (40 + 5L) μin | |
| Accumulated Pitch Deviation | (0.039 to 5.7) in | (40 + 5L) μin | |
| Flank Angles | Pitch ≤ 0.0394 in (1 mm) | (0° 6'' 0')/p | p = Pitch |
| Pitch > 0.0394 in (1 mm) | 0° 6'' 0' | ||
| Taper | (0.039 to 5.7) in | 22 μin | |
| Taper Pipe Thread Rings Effective Pitch Diameter |
(0.118 to 6) in | (80 + 5L) μin | Method: ACP-024; IAC Masterscanner |
| Simple Pitch Diameter | (0.118 to 6) in | (80 + 5L) μin | |
| Major Diameter | (0.118 to 6) in | (80 + 5L) μin | |
| Minor Diameter | (0.118 to 6) in | (100 + 5L) μin | |
| Thread Pitch | (0.118 to 6) in | (40 + 5L) μin | |
| Accumulated Pitch Deviation | (0.118 to 6) in | (40 + 5L) μin | |
| Flank Angles | Pitch ≤ 0.0394 in (1 mm) | (0° 6'' 0')/p | p = Pitch |
| Pitch > 0.0394 in (1 mm) | 0° 6'' 0' | ||
| Taper | (0.118 to 6) in | 22 μin | |
| Thread Plug Gages & Setting Plug Gages | (2 to 120) TPI, up to 12 in | (100 + 2D) μin | Method: ACP-025; UMM, DMS 680 & thread wires |
| Effective Pitch Diameter | (0.039 to 5.7) in | (80 + 5L) μin | IAC Masterscanner |
| Simple Pitch Diameter | (0.039 to 5.7) in | (80 + 5L) μin | |
| Major Diameter | (0.039 to 5.7) in | (80 + 5L) μin | |
| Minor Diameter | (0.039 to 5.7) in | (100 + 5L) μin | |
| Thread Pitch | (0.039 to 5.7) in | (40 + 5L) μin | |
| Accumulated Pitch Deviation | (0.039 to 5.7) in | (40 + 5L) μin | |
| Flank Angles | Pitch ≤ 0.0394 in (1 mm) | (0° 6'' 0')/p | p = Pitch |
| Pitch > 0.0394 in (1 mm) | 0° 6'' 0' | ||
| Taper | (0.039 to 5.7) in | 22 μin | |
| Ring Gages (ID) | (0.06 to 12) in | (19 + 2D) μin | Method: ACP-026; UMM, DMS 680, Pratt & Whitney 1000M |
| Taper | (0.039 to 6) in | 5 μin | IAC Masterscanner |
| Diameter | (0.039 to 6) in | (40 + 2L) μin | IAC Masterscanner |
| Thread Ring Gages | Up to 6 in | (100 + 2D) μin | Method: ACP-027; setting plugs |
| Effective Pitch Diameter | (0.118 to 6) in | (80 + 5L) μin | IAC Masterscanner |
| Simple Pitch Diameter | (0.118 to 6) in | (80 + 5L) μin | |
| Major Diameter | (0.118 to 6) in | (80 + 5L) μin | |
| Minor Diameter | (0.118 to 6) in | (100 + 5L) μin | |
| Thread Pitch | (0.118 to 6) in | (40 + 5L) μin | |
| Accumulated Pitch Deviation | (0.118 to 6) in | (40 + 5L) μin | |
| Flank Angles | Pitch ≤ 0.0394 in (1 mm) | (0° 6'' 0')/p | p = Pitch |
| Pitch > 0.0394 in (1 mm) | 0° 6'' 0' | ||
| Taper | (0.118 to 6) in | 22 μin | |
| Bore Gages | Up to 6 in | 48 μin | Ring gages |
| Calipers3 | Up to 80 in | (400 + 2.5L) μin | Method: ACP-004; gage blocks & rod standards |
| Height Gages3 | Up to 40 in | 400 μin | Method: ACP-013; gage blocks, length rods |
| Digital, Dial & Test Indicators3 | Up to 2 in | 70 μin | Method: ACP-007; gage blocks |
| LVDT | Up to 8 in | 0.002 in | Method: ACP-007A |
| Micrometers3 Outside |
Up to 36 in | (33 + 10L) μin | Method: ACP-016 Gage blocks & rod standards |
| (37 to 60) in | (360 + 21L) μin | ||
| Inside | Up to 40 in | (51 + 1.4L) μin | Universal measuring machine, Pratt & Whitney 1000M |
| Depth | Up to 12 in | 60 μin | Gage blocks |
| Laser Micrometers | Up to 2 in | 39 μin | Plug gages |
| Parallels | Up to 30 in | 45 μin | Surface plate LVDT indicator |
| Pin Gages3 | (0.011 to 1) in | (19 + 2D) μin | Method: ACP-019; universal measuring machine, DMS 680 |
| (0.011 to 1) in | 56 μin | Micrometer | |
| Surface Roughness Standards | (15 to 150) μin Ra | 1.7 μin | Verification of specimens per ASME B46.1 |
| Profilometers | 17 μin Ra; 119 μin Ra | 1.5 μin | Method: ACP-021; roughness specimen |
| Clinometers & Inclinometers, & Electronic Levels | Up to 90° | 0.075° | Sine plate/gage blocks |
| Levels (Spirit, Bubble, Machinist)3 | Up to 15 in | 400 μin | Surface plate & gage blocks |
| Rules & Tapes3 | Up to 100 ft | 0.04 in | Method: ACP-046; steel rule/optical scale |
| Optical Comparators & Measuring Machines3 Axis Linearity |
Up to 12 in | 80 μin | Method: ACP-018 Master calibration artifact |
| Magnification | 5x | 440 μin | Magnification checker scale |
| 10x | 440 μin | ||
| 20x | 440 μin | ||
| 50x | 440 μin | ||
| 100x | 440 μin | ||
| Angularity | Up to 360° | 0’65’’ | Sine bar & gage blocks or angle blocks |
Notes from the A2LA scope:
- 2 CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
- 3 Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
- 4 Percentages are percentage of reading unless otherwise indicated. L = nominal length in inches, D = nominal diameter in inches, I.V. = Indicated Value.
Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.
Electrical – DC/Low Frequency
| Parameter/Equipment | Range | CMC2, 4, 5 (±) | Comments |
|---|---|---|---|
| DC Voltage – Generate3 | (0 to 330) mV | 27 μV/V + 1 μV | Method: ACP-070; Fluke 5522A |
| 330 mV to 3.3 V | 4 μV/V + 2 μV | ||
| (3.3 to 33) V | 15 μV/V + 20 μV | ||
| (3 to 330) V | 22 μV/V + 150 μV | ||
| (330 to 1000) V | 23 μV/V + 1.5 mV | ||
| DC Voltage – Measure3 | (0 to 100) mV | 12 μV/V + 0.2 μV | Method: ACP-070; Fluke 8588A |
| 100 mV to 1 V | 2 μV/V + 0.3 μV | ||
| (1 to 10) V | 2 μV/V + 0.5 μV | ||
| (10 to 100) V | 7 μV/V + 30 μV | ||
| (100 to 1000) V | 19 μV/V + 5 mV | ||
| (1000 to 150 000) V | 1.2 mV/V + 12 μV | Ross VD150 Voltage Divider, Keithley DMM7510 | |
| DC Current – Generate3 | (0 to 330) μA | 170 μA/A + 0.02 μA | Method: ACP-070; Fluke 5522A |
| 330 μA to 3.3 mA | 130 μA/A + 0.05 μA | ||
| (3.3 to 33) mA | 120 μA/A + 0.25 μA | ||
| (33 to 330) mA | 120 μA/A + 2.5 μA | ||
| 330 mA to 1 A | 230 μA/A + 40 μA | ||
| (1 to 3) A | 430 μA/A + 40 μA | ||
| (3 to 10) A | 510 μA/A + 500 μA | ||
| (10 to 20) A | 1.2 mA/A + 750 μA | ||
| Non-Toroidal Type | (10 to 1000) A | 0.8 % | Fluke 5522A plus coil, clamp-on only |
| DC Current – Measure3 | (0 to 10) μA | 9 μA/A + 0.4 nA | Method: ACP-070; Fluke 8588A |
| (10 to 100) μA | 18 μA/A + 1 nA | ||
| 100 μA to 1 mA | 16 μA/A + 4 nA | ||
| (1 to 10) mA | 17 μA/A + 40 nA | ||
| (10 to 100) mA | 57 μA/A + 1 μA | ||
| 100 mA to 1 A | 300 μA/A + 100 μA | ||
| (1 to 10) A | 270 μA/A + 0.4 μA | ||
| (10 to 100) A | 3 mA/A + 1 μA | Keithley DMM7510 with Empro shunts | |
| (100 to 1000) A | 3 mA/A + 1 μA | ||
| Resistance – Generate3 | (0 to 11) Ω | 0.005 % + 1 mΩ | Method: ACP-070; Fluke 5522A |
| (11 to 33) Ω | 0.004 % + 1.5 mΩ | ||
| (33 to 110) Ω | 0.004 % + 1.4 mΩ | ||
| (110 to 330) Ω | 0.033 % + 2 mΩ | ||
| 330 Ω to 1.1 kΩ | 0.004 % + 20 mΩ | ||
| (1.1 to 3.3) kΩ | 0.004 % + 20 mΩ | ||
| (3.3 to 11) kΩ | 0.004 % + 20 mΩ | ||
| (11 to 33) kΩ | 0.004 % + 0.2 Ω | ||
| (33 to 110) kΩ | 0.004 % + 0.2 Ω | ||
| (110 to 330) kΩ | 0.004 % + 2 Ω | ||
| 330 kΩ to 1.1 MΩ | 0.011 % + 2 Ω | ||
| (1.1 to 3.3) MΩ | 0.015 % + 30 Ω | ||
| (3.3 to 11) MΩ | 0.041 % + 50 Ω | ||
| (11 to 33) MΩ | 0.056 % + 2500 Ω | ||
| (33 to 110) MΩ | 0.07 % + 3 kΩ | ||
| (110 to 330) MΩ | 0.38 % + 100 kΩ | ||
| (330 to 1100) MΩ | 1.8 % + 500 kΩ | ||
| Resistance – Measure3 | (0 to 1) Ω | 0.003 % + 4 μΩ | Method: ACP-070; Fluke 8588A |
| (1 to 10) Ω | 0.002 % + 0.02 mΩ | ||
| (10 to 100) Ω | 0.002 % + 0.05 mΩ | ||
| 100 Ω to 1 kΩ | 0.002 % + 0.5 mΩ | ||
| (1 to 10) kΩ | 0.002 % + 5 mΩ | ||
| (10 to 100) kΩ | 0.002 % + 50 mΩ | ||
| 100 kΩ to 1 MΩ | 0.002 % + 1 Ω | ||
| (1 to 10) MΩ | 0.02 % + 100 Ω | ||
| (10 to 100) MΩ | 0.03 % + 10 kΩ | ||
| 100 MΩ to 1 GΩ | 0.3 % + 1 MΩ | ||
| Electrical Calibration of RTD Indicators & Indicating System – Generate Simulation3 Pt 385, 100 Ω |
(-200 to 800) °C | 0.08 °C | Method: ACP-070; Fluke 5522A |
| Electrical Calibration of RTD Indicators & Indicating System – Measure Simulation3 Pt 385, 100 Ω |
(-200 to 800) °C | 0.08 °C | Method: ACP-070; Keithley DMM7510 |
| Electrical Calibration of Thermocouple Indicators & Indicating Systems3 Type B |
(600 to 800) °C | 0.44 °C | Method: ACP-070; Fluke 5522A |
| (800 to 1000) °C | 0.35 °C | ||
| (1000 to 1550) °C | 0.34 °C | ||
| (1500 to 1820) °C | 0.34 °C | ||
| Type E | (-250 to 1000) °C | 0.24 °C | |
| Type J | (-210 to -100) °C | 0.31 °C | |
| (-100 to 760) °C | 0.16 °C | ||
| (760 to 1200) °C | 0.27 °C | ||
| Type K | (-200 to 100) °C | 0.38 °C | |
| (-100 to 120) °C | 0.19 °C | ||
| (120 to 1000) °C | 0.30 °C | ||
| (1000 to 1372) °C | 0.46 °C | ||
| Type N | (-200 to 1300) °C | 0.31 °C | |
| Type R | (0 to 1767) °C | 0.65 °C | |
| Type S | (0 to 1767) °C | 0.54 °C | |
| Type T | (-250 to 400) °C | 0.72 °C | |
| (-150 to 400) °C | 0.16 °C |
| Parameter/Range | Frequency | CMC2, 4, 5 (±) | Comments |
|---|---|---|---|
| AC Voltage – Generate3 (1 to 33) mV |
(10 to 45) Hz | 0.018 % + 6 μV | Method: ACP-070; Fluke 5522A |
| 45 Hz to 10 kHz | 0.018 % + 6 μV | ||
| (10 to 20) kHz | 0.025 % + 6 μV | ||
| (20 to 50) kHz | 0.12 % + 6 μV | ||
| (50 to 100) kHz | 0.4 % + 12 μV | ||
| (100 to 500) kHz | 0.91 % + 50 μV | ||
| (33 to 330) mV | (10 to 45) Hz | 0.034 % + 8 μV | |
| 45 Hz to 10 kHz | 0.017 % + 8 μV | ||
| (10 to 20) kHz | 0.019 % + 8 μV | ||
| (20 to 50) kHz | 0.04 % + 8 μV | ||
| (50 to 100) kHz | 0.091 % + 32 μV | ||
| (100 to 500) kHz | 0.23 % + 70 μV | ||
| 330 mV to 3.3 V | (10 to 45) Hz | 0.02 % + 60 μV | |
| 45 Hz to 10 kHz | 0.02 % + 60 μV | ||
| (10 to 20) kHz | 0.035 % + 50 μV | ||
| (20 to 50) kHz | 0.08 % + 50 μV | ||
| (50 to 100) kHz | 0.28 % + 600 μV | ||
| (100 to 500) kHz | 0.28 % + 600 μV | ||
| (3.3 to 33) V | 45 Hz to 1 kHz | 0.018 % + 600 μV | |
| (1 to 10) kHz | 0.018 % + 600 μV | ||
| (10 to 20) kHz | 0.03 % + 600 μV | ||
| (20 to 50) kHz | 0.04 % + 600 μV | ||
| (50 to 100) kHz | 0.11 % + 1.6 mV | ||
| (33 to 330) V | 45 Hz to 1 kHz | 0.022 % + 2 mV | |
| (1 to 10) kHz | 0.017 % + 8 μV | ||
| (10 to 20) kHz | 0.029 % + 6 mV | ||
| (20 to 50) kHz | 0.036 % + 6 mV | ||
| (50 to 100) kHz | 0.23 % + 50 mV | ||
| (330 to 1000) V | 45 Hz to 1 kHz | 0.035 % + 10 mV | |
| (1 to 5) kHz | 0.03 % + 10 mV | ||
| (5 to 10) kHz | 0.035 % + 10 mV | ||
| AC Voltage – Measure3 (0 to 10) mV |
1 Hz to 10 Hz | 0.6 % + 2 μV | Method: ACP-070; Fluke 8588A |
| 10 Hz to 2 kHz | 0.06 % + 2 μV | ||
| (2 to 10) kHz | 0.06 % + 2 μV | ||
| (10 to 30) kHz | 0.07 % + 2 μV | ||
| (30 to 100) kHz | 0.45 % + 2 μV | ||
| (100 to 300) kHz | 1.40 % + 4 μV | ||
| (300 to 500) kHz | 3.4 % + 4 μV | ||
| (10 to 100) mV | 1 Hz to 10 Hz | 0.011 % + 0.5 μV | |
| 10 Hz to 2 kHz | 0.011 % + 0.5 μV | ||
| (2 to 10) kHz | 0.02 % + 0.5 μV | ||
| (10 to 30) kHz | 0.03 % + 1 μV | ||
| (30 to 100) kHz | 0.08 % + 5 μV | ||
| (100 to 300) kHz | 0.3 % + 30 μV | ||
| (300 to 500) kHz | 1.5 % + 0.1 mV | ||
| 100 mV to 1 V | 1 Hz to 10 Hz | 0.01 % + 5 μV | |
| 10 Hz to 2 kHz | 0.01 % + 5 μV | ||
| (2 to 10) kHz | 0.015 % + 5 μV | ||
| (10 to 30) kHz | 0.03 % + 5 μV | ||
| (30 to 100) kHz | 0.08 % + 50 μV | ||
| (100 to 300) kHz | 0.31 % + 0.3 mV | ||
| (300 to 500) kHz | 1.5 % + 1 mV | ||
| (1 to 10) V | 1 Hz to 10 Hz | 0.01 % + 50 μV | |
| 10 Hz to 2 kHz | 0.01 % + 50 μV | ||
| (2 to 10) kHz | 0.015 % + 50 μV | ||
| (10 to 30) kHz | 0.03 % + 100 μV | ||
| (30 to 100) kHz | 0.08 % + 500 μV | ||
| (100 to 300) kHz | 0.31 % + 3 mV | ||
| (300 to 500) kHz | 1.40 % + 10 mV | ||
| (10 to 100) V | 1 Hz to 10 Hz | 0.01 % + 500 μV | |
| 10 Hz to 2 kHz | 0.01 % + 500 μV | ||
| (2 to 10) kHz | 0.013 % + 500 μV | ||
| (10 to 30) kHz | 0.03 % + 1 mV | ||
| (30 to 100) kHz | 0.08 % + 5 mV | ||
| (100 to 300) kHz | 0.16 % + 50 mV | ||
| (100 to 1000) V | 1 Hz to 50 Hz | 0.02 % + 10 mV | |
| 50 Hz to 2 kHz | 0.02 % + 25 mV | ||
| (2 to 10) kHz | 0.02 % + 25 mV | ||
| (10 to 30) kHz | 0.031 % + 25 mV | ||
| (30 to 100) kHz | 0.05 % + 25 mV | ||
| (1000 to 100 000) V | (50 to 1) kHz | 6 mV/V + 3 mV | Ross VD150 Voltage Divider, Keithley DMM7510 |
| AC Current – Generate3 (29 to 330) μA |
10 Hz to 30 kHz | 0.15 % + 0.1 μA | Method: ACP-070; Fluke 5522A |
| 330 μA to 3.3 mA | 0.12 % + 0.15 μA | ||
| (3.3 to 33) mA | 0.042 % + 2 μA | ||
| (33 to 330) mA | 0.047 % + 20 μA | ||
| 330 mA to 1 A | 5 Hz to 10 Hz | 0.21 % + 100 μA | |
| 10 Hz to 1 kHz | 0.06 % + 100 μA | ||
| 1 kHz to 10 kHz | 2.9 % + 5 mA | ||
| 330 mA to 3 A | 50 Hz to 1 kHz | 0.074 % + 100 μA | |
| 1 kHz to 5 kHz | 0.7 % + 1 mA | ||
| (2 to 20) A | 1 Hz to 5 kHz | 0.18 % + 5 mA | |
| Up to 10 A | 60 Hz to 440 Hz | 1.3 % | Fluke 5522A plus coil, clamp-on only |
| (10 to 300) A | 60 Hz to 440 Hz | 1.0 % | |
| (300 to 1000) A | 60 Hz | 0.4 % | |
| AC Current – Measure3 (5 to 100) μA |
40 Hz to 5 kHz | 0.07 % + 300 nA | Method: ACP-070; Keithley DMM7510 |
| (5 to 10) kHz | 0.11 % + 300 nA | ||
| 100 μA to 1 mA | 40 Hz to 10 kHz | 0.15 % + 300 nA | |
| (1 to 10) mA | 40 Hz to 10 kHz | 0.11 % + 3 μA | |
| (10 to 100) mA | 40 Hz to 10 kHz | 0.11 % + 30 μA | |
| 100 mA to 1 A | 40 Hz to 10 kHz | 1.1 % + 400 μA | |
| (5 to 10) kHz | 2.3 % + 400 μA | ||
| (1 to 3) A | 40 Hz to 5 kHz | 1 % + 1.5 mA | |
| (5 to 10) kHz | 2.3 % + 1.5 mA | ||
| (3 to 10) A | 40 Hz to 5 kHz | 1 % + 5 mA | |
| (5 to 10) kHz | 2.3 % + 5 mA |
Notes from the A2LA scope:
- 2 CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
- 3 Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
- 4 Percentages are percentage of reading unless otherwise indicated. L = nominal length in inches, D = nominal diameter in inches, I.V. = Indicated Value.
- 5 Measured values are determined using the instrument listed in Comments. CMCs are expressed as a value covering the full range, or as a percentage of reading plus a fixed floor.
Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.
Mechanical
| Parameter/Equipment | Range | CMC2, 4, 6 (±) | Comments |
|---|---|---|---|
| Indirect Verification of Brinell Hardness Testers3 | HBW 10/500 (15.9 to 109) | 1.1 HBW | Method: ACP-020D; ASTM E10 |
| HBW 10/3000 (95.5 to 650) | 2.0 HBW | ||
| Brinell Force (Direct Verification)3 | (0 to 3000) kg load | 0.16 kg | Method: ACP-020F; load cell |
| Brinell Scope (Direct Verification) | (0 to 7) mm | 0.029 mm | Stage micrometer; ASTM E10 |
| Indirect Verification of Microindentation Hardness Testers3 Vickers ≥ 1 kgf |
(200 to 850) HV | 2 HV | Method: ACP-020A; ASTM E92 / E384 |
| Vickers < 1 kgf | (200 to 850) HV | 12 HV | |
| Knoop ≥ 1 kgf | (200 to 850) HK | 9 HK | |
| Knoop < 1 kgf | (200 to 850) HK | 13 HK | |
| Indirect Verification of Rockwell Hardness Testers3 | (80 to 84) HRA | 0.15 HRA | Method: ACP-020; ASTM E18 |
| (70 to 78) HRA | 0.17 HRA | ||
| (20 to 65) HRA | 0.27 HRA | ||
| (80 to 100) HRBW | 0.42 HRBW | ||
| (60 to 79) HRBW | 0.26 HRBW | ||
| (40 to 59) HRBW | 0.35 HRBW | ||
| (60 to 65) HRC | 0.32 HRC | ||
| (35 to 55) HRC | 0.33 HRC | ||
| (20 to 30) HRC | 0.41 HRC | ||
| (93 to 100) HREW | 0.57 HREW | ||
| (84 to 90) HREW | 0.57 HREW | ||
| (70 to 79) HREW | 0.44 HREW | ||
| (94 to 100) HRFW | 0.57 HRFW | ||
| (80 to 90) HRFW | 0.53 HRFW | ||
| (60 to 75) HRFW | 0.53 HRFW | ||
| (< 96) HRHW | 0.42 HRHW | ||
| (≥ 96) HRHW | 0.35 HRHW | ||
| (90 to 92) HR15N | 0.51 HR15N | ||
| (78 to 88) HR15N | 0.42 HR15N | ||
| (70 to 77) HR15N | 0.30 HR15N | ||
| (87 to 93) HR15TW | 0.30 HR15TW | ||
| (81 to 86) HR15TW | 0.28 HR15TW | ||
| (74 to 80) HR15TW | 0.27 HR15TW | ||
| (77 to 82) HR30N | 0.31 HR30N | ||
| (55 to 73) HR30N | 0.32 HR30N | ||
| (42 to 50) HR30N | 0.40 HR30N | ||
| (70 to 83) HR30TW | 0.21 HR30TW | ||
| (57 to 69) HR30TW | 0.22 HR30TW | ||
| (43 to 56) HR30TW | 0.62 HR30TW | ||
| (66 to 72) HR45N | 0.23 HR45N | ||
| (37 to 61) HR45N | 0.27 HR45N | ||
| (20 to 31) HR45N | 0.33 HR45N | ||
| (66 to 72) HR45TW | 0.43 HR45TW | ||
| (37 to 61) HR45TW | 0.47 HR45TW | ||
| (20 to 31) HR45TW | 0.70 HR45TW | ||
| (60 to 70) HR45XW | 0.75 HR45XW | ||
| (70 to 100) HR45XW | 0.24 HR45XW | ||
| EQUOTIP (Leeb) – Indirect Verification, Fixed Point3 | 801 Leeb D Hardness | 16 Leeb D Hardness | Method: ACP-020C; ASTM A956 |
| Scales & Balances3 | 1 mg to 320 g | 3.0 μg/g + 20 μg | Method: ACP-047 Class 1 weights |
| (> 320 to 5000) g | 3.0 μg/g + 1 mg | Class 1 weights | |
| (> 5 to 10) kg | 4.7 μg/g + 1 mg | Class 1 & 2 weights | |
| (> 10 to 30) kg | 0.72 g | Class 4 weights | |
| (30 to 20 000) lbs | 0.015 % of I.V. | Class F weights | |
| (> 20 000 to 200 000) lbs | 0.03 % of I.V. | Class F weights | |
| Direct Verification of Durometers Indenter Extension & Shape: Radius |
Up to 1 in | 0.0002 in | Method: ASTM D2240 Optical inspection under 50x magnification |
| Angle | Up to 90° | 0.05° | |
| Extension | Up to 1 in | 0.0002 in | Gage blocks |
| Spring Calibration Force: Type A, O | Up to 8.9 N | 0.0008 N | Load force stand |
| Type D, C | Up to 45 N | 0.03 N | |
| Type OO, OOO | Up to 1.2 N | 0.0007 N | |
| Rheometer3 Torque @ (0.5, 1, 3) degrees arc |
(0 to 200) lbf·in | 0.25 lbf·in | Torque; ASTM D5289; ASTM D2084 |
| Mooney Viscometer3 | (0 to 200) Mooney | 0.12 Mooney | ASTM D1646 |
| Pressure Measure & Generate, Transducers & Transmitters3 | (-14.7 to 300) psig | 0.009 psi | Method: ACP-038 Druck DPI-611 |
| (> 300 to 1000) psig | 0.040 psi | ||
| (> 1000 to 5000) psig | 0.005 % rdg + 0.06 psig | Druck CR2200 | |
| (> 5000 to 15 000) psig | 0.002 % rdg + 2.3 psig | Druck DPI104 | |
| (100 to 10 000) psig | 0.008 % rdg | Ametek T-100 DWT | |
| (500 to 60 000) psig | 0.042 % rdg | Fluke P3860 DWT | |
| Force, Measure – Transducers & Load Cells (Tension & Compression)3 | Up to 100 000 lbf | 0.4 % of Indicated Value | Method: ACP-049; ASTM E4 & load cells |
| Up to 500 000 lbf | 0.05 % of Indicated Value | ||
| Up to 600 000 lbf (Compression only) | 0.02 % of Indicated Value | ||
| Extensometer Displacement3 | Up to 2 in | 18 μin | Method: ACP-051; ASTM E83; ASTM E399 |
| Material Testing System Crosshead Displacement or Actuator Stroke3 | Up to 24 in | 0.001 in | Method: ACP-052; ASTM E2309/E2309M |
| Material Testing System Crosshead/Actuator Speed3 | 12 in/min | 0.006 in/min | Method: ACP-052; ASTM 2658 |
| Load Cells – Tension & Compression3 | Up to 5000 lbf | 0.02 % Indicated Value | Method: ACP-050; ASTM E74 |
| (5001 to 100 000) lbf | 0.02 % Indicated Value | ||
| Force Gauges3 | Up to 1000 lbf | 0.15 % of Indicated Value | Method: ACP-049A; NIST Class F weights |
| Dynamometer | Up to 100 000 lbf | 0.03 % of Indicated Value | Morehouse machine |
| Torque – Calibration of Torque Meters & Sensors | Up to 1000 lbf·ft | 0.05 % of Applied Load | Method: ACP-031; torque arms with weights, including specific arms |
| Torque Wrenches3 | (4 to 50) lbf·in | 0.17 lbf·in | Method: ACP-030; CDI torque calibrator using load cells |
| (30 to 400) lbf·in | 1.2 lbf·in | ||
| (80 to 1000) lbf·in | 1.4 lbf·in | ||
| (20 to 250) lbf·ft | 1.2 lbf·ft | ||
| (250 to 1000) lbf·ft | 1.4 lbf·ft | ||
| Mass – Fixed Points | 1 mg | 16 μg | Method: ACP-001 Comparison to Class 1 weights |
| 10 mg | 16 μg | ||
| 20 mg | 9.9 μg | ||
| 30 mg | 16 μg | ||
| 50 mg | 13 μg | ||
| 100 mg | 23 μg | ||
| 200 mg | 11 μg | ||
| 300 mg | 9.9 μg | ||
| 500 mg | 17 μg | ||
| 1 g | 12 μg | ||
| 2 g | 14 μg | ||
| 3 g | 15 μg | ||
| 5 g | 16 μg | ||
| 10 g | 22 μg | ||
| 20 g | 26 μg | ||
| 30 g | 28 μg | ||
| 50 g | 32 μg | ||
| 100 g | 55 μg | ||
| 200 g | 100 μg | ||
| 500 g | 670 μg | ||
| 1000 g | 1.3 mg | ||
| 2000 g | 10 mg | ||
| 5000 g | 10 mg | ||
| 10 kg | 280 mg | Comparison to Class 4 weights | |
| 0 g | 340 mg | ||
| 0.001 lb (0.453 592 37 g) | 12 μg | ||
| 0.002 lb (0.907 184 74 g) | 38 μg | ||
| 0.005 lb (2.267 961 9 g) | 16 μg | ||
| 0.01 lb (4.535 924 g) | 22 μg | ||
| 0.02 lb (9.071 847 g) | 47 μg | ||
| 0.05 lb (22.679 62 g) | 34 μg | ||
| 0.1 lb (45.3592 g) | 90 μg | ||
| 0.2 lb (90.7185 g) | 54 μg | ||
| 0.5 lb (226.796 g) | 190 μg | ||
| 1 lb (453.592 g) | 6.2 mg | ||
| 2 lb (907.185 g) | 9.1 mg | ||
| 5 lb (2267.96 g) | 22 mg | ||
| 10 lb (4535.92 g) | 25 mg | ||
| 25 lb (11 339.8 g) | 280 mg | ||
| 30 lb (13 607.8 g) | 260 mg | ||
| 50 lb (22 679.6 g) | 320 mg | ||
| 500 lb (226 796 g) | 6.2 g | Comparison to Class F weights | |
| 1000 lb (453 592 g) | 7.6 g |
Notes from the A2LA scope:
- 2 CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
- 3 Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
- 4 Percentages are percentage of reading unless otherwise indicated. L = nominal length in inches, D = nominal diameter in inches, I.V. = Indicated Value.
- 6 The type of instrument or material being calibrated is defined by the parameter; the lab can calibrate instruments that measure or generate values in the ranges listed.
Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.
Thermodynamics
| Parameter/Equipment | Range | CMC2, 6 (±) | Comments |
|---|---|---|---|
| Relative Humidity – Measure: Hygrometers, Chart Recorders, Thermo-Hygrometers, Data Loggers3 | (10 to 95) % RH | 1.3 % RH | Method: ACP-037; Vaisala SP2000-20R, Red Lion PAX panel meter |
| Temperature Measure – Chart Recorders, Thermo-Hygrometers, Data Loggers, Controllers, Thermometers3 | (-40 to 100) °C | 0.08 °C | Method: ACP-037; Vaisala SP2000-20R, 7510 DMM with RTD probe |
| (> 100 to 300) °C | 0.13 °C | ||
| (> 300 to 1205) °C | 0.9 °C | ||
| Infrared Temperature – Measuring Equipment3 λ = (8 to 14) μm |
(35 to 100) °C | 0.6 °C | Method: ACP-037 Fluke 4181 precision infrared calibrator, ε = 0.95 |
| (100 to 200) °C | 0.66 °C | ||
| (200 to 350) °C | 0.86 °C | ||
| (350 to 500) °C | 1.2 °C | ||
| (500 to 1200) °C | 2.0 °C | Pegasus R, ε = 0.995 | |
| Ovens, Furnaces, Chambers & Freezers3 | (-30 to 0) °C | 1.4 °C | Method: ACP-037; ASTM E145; uniformity Keithley DMM7510 with RTD probe |
| (0 to 1200) °C | 1.7 °C | Omega DAQ56 data acquisition system & thermocouples |
Notes from the A2LA scope:
- 2 CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
- 3 Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
- 6 The type of instrument or material being calibrated is defined by the parameter; the lab can calibrate instruments that measure or generate values in the ranges listed.
Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.
Time & Frequency
| Parameter/Equipment | Range | CMC2, 6 (±) | Comments |
|---|---|---|---|
| Digital / Mechanical Tachometer3 | (40 to 300) rpm | 0.5 % rdg + 1 LSD | Method: ACP-041; direct reflective pickup tachometer (LSD = least significant digit) |
| (300 to 3000) rpm | 0.1 % rdg + 1 LSD | ||
| (3000 to 99 999) rpm | 0.1 % rdg + 1 LSD | ||
| Time Interval – Timers & Stopwatches3 | 15 s to 24 hr | 0.36 s (24 hr test) | Method: ACP-048; NIST synchronized time |
| Frequency Generate – Measuring Equipment3 | 0.01 Hz to 2 MHz | 3 μHz/Hz + 5 μHz | Method: ACP-070; Fluke 5522A |
| Frequency – Measure3 | (1 to 10) Hz | 2 μHz/Hz | Method: ACP-070; Fluke 8588A |
| (10 to 1000) Hz | 69 nHz/Hz | ||
| (1 to 10) kHz | 32 nHz/Hz | ||
| (10 to 100) kHz | 15 nHz/Hz | ||
| 100 kHz to 10 MHz | 14 nHz/Hz |
Notes from the A2LA scope:
- 2 CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
- 3 Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
- 6 The type of instrument or material being calibrated is defined by the parameter; the lab can calibrate instruments that measure or generate values in the ranges listed.
Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.
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The documents above describe our lab's accreditation. Certificates for your calibrated equipment are available 24/7 in the client portal — see How to Retrieve Certificates.
