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SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to our laboratory to perform the following Dimensional calibrations for gage blocks, length bars, plug gages (OD), taper pipe thread plugs and rings, thread plug and setting plug gages, ring gages (ID), thread ring gages, bore gages, calipers, height gages, digital, dial and test indicators, LVDTs, micrometers (outside, inside, depth and laser), parallels, pin gages, surface roughness standards, profilometers, clinometers, inclinometers and electronic levels, spirit and machinist levels, rules and tapes, and optical comparators and measuring machines.

Some of our featured equipment for dimensional calibration includes:

Labmaster® Universal - 80 Inch Capacity

IAC Masterscanner

Microrep DMS 680

Full details are listed below. You can also search all of our accredited calibrations or learn more about our in-lab calibration service.

A2LA Accredited Calibration Lab – ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994
Certificate No. 1848.01 · Valid to August 31, 2027

Download Full Scope of Accreditation (PDF) Search all accredited calibrations »

Dimensional Calibration Scope Includes:

Parameter/Equipment	Range⁴	CMC^{2, 4} (±)	Comments
Gage Blocks	Up to 4 in	(1.6 + 2L) μin	Method: ACP-023; by mechanical comparison UMM DMS680, Pratt & Whitney 1000M
	(5 to 20) in	(19 + 0.8L) μin
Length Bars	Up to 80 in	(18 + 2.2L) μin	Method: ACP-010; by UMM, Pratt & Whitney 1000M
Plug Gages (OD)	Up to 12 in	(17 + 3.9D) μin	Method: ACP-024; UMM, DMS 680, Pratt & Whitney 1000M
Taper	(0.039 to 5.7) in	5 μin	IAC Masterscanner
Diameter	(0.039 to 5.7) in	(80 + 2L) μin	IAC Masterscanner
Taper Pipe Thread Plugs Effective Pitch Diameter	(0.039 to 5.7) in	(80 + 5L) μin	Method: ACP-025; IAC Masterscanner
Simple Pitch Diameter	(0.039 to 5.7) in	(80 + 5L) μin
Major Diameter	(0.039 to 5.7) in	(80 + 5L) μin
Minor Diameter	(0.039 to 5.7) in	(100 + 5L) μin
Thread Pitch	(0.039 to 5.7) in	(40 + 5L) μin
Accumulated Pitch Deviation	(0.039 to 5.7) in	(40 + 5L) μin
Flank Angles	Pitch ≤ 0.0394 in (1 mm)	(0° 6'' 0')/p	p = Pitch
	Pitch > 0.0394 in (1 mm)	0° 6'' 0'
Taper	(0.039 to 5.7) in	22 μin
Taper Pipe Thread Rings Effective Pitch Diameter	(0.118 to 6) in	(80 + 5L) μin	Method: ACP-024; IAC Masterscanner
Simple Pitch Diameter	(0.118 to 6) in	(80 + 5L) μin
Major Diameter	(0.118 to 6) in	(80 + 5L) μin
Minor Diameter	(0.118 to 6) in	(100 + 5L) μin
Thread Pitch	(0.118 to 6) in	(40 + 5L) μin
Accumulated Pitch Deviation	(0.118 to 6) in	(40 + 5L) μin
Flank Angles	Pitch ≤ 0.0394 in (1 mm)	(0° 6'' 0')/p	p = Pitch
	Pitch > 0.0394 in (1 mm)	0° 6'' 0'
Taper	(0.118 to 6) in	22 μin
Thread Plug Gages & Setting Plug Gages	(2 to 120) TPI, up to 12 in	(100 + 2D) μin	Method: ACP-025; UMM, DMS 680 & thread wires
Effective Pitch Diameter	(0.039 to 5.7) in	(80 + 5L) μin	IAC Masterscanner
Simple Pitch Diameter	(0.039 to 5.7) in	(80 + 5L) μin
Major Diameter	(0.039 to 5.7) in	(80 + 5L) μin
Minor Diameter	(0.039 to 5.7) in	(100 + 5L) μin
Thread Pitch	(0.039 to 5.7) in	(40 + 5L) μin
Accumulated Pitch Deviation	(0.039 to 5.7) in	(40 + 5L) μin
Flank Angles	Pitch ≤ 0.0394 in (1 mm)	(0° 6'' 0')/p	p = Pitch
	Pitch > 0.0394 in (1 mm)	0° 6'' 0'
Taper	(0.039 to 5.7) in	22 μin
Ring Gages (ID)	(0.06 to 12) in	(19 + 2D) μin	Method: ACP-026; UMM, DMS 680, Pratt & Whitney 1000M
Taper	(0.039 to 6) in	5 μin	IAC Masterscanner
Diameter	(0.039 to 6) in	(40 + 2L) μin	IAC Masterscanner
Thread Ring Gages	Up to 6 in	(100 + 2D) μin	Method: ACP-027; setting plugs
Effective Pitch Diameter	(0.118 to 6) in	(80 + 5L) μin	IAC Masterscanner
Simple Pitch Diameter	(0.118 to 6) in	(80 + 5L) μin
Major Diameter	(0.118 to 6) in	(80 + 5L) μin
Minor Diameter	(0.118 to 6) in	(100 + 5L) μin
Thread Pitch	(0.118 to 6) in	(40 + 5L) μin
Accumulated Pitch Deviation	(0.118 to 6) in	(40 + 5L) μin
Flank Angles	Pitch ≤ 0.0394 in (1 mm)	(0° 6'' 0')/p	p = Pitch
	Pitch > 0.0394 in (1 mm)	0° 6'' 0'
Taper	(0.118 to 6) in	22 μin
Bore Gages	Up to 6 in	48 μin	Ring gages
Calipers³	Up to 80 in	(400 + 2.5L) μin	Method: ACP-004; gage blocks & rod standards
Height Gages³	Up to 40 in	400 μin	Method: ACP-013; gage blocks, length rods
Digital, Dial & Test Indicators³	Up to 2 in	70 μin	Method: ACP-007; gage blocks
LVDT	Up to 8 in	0.002 in	Method: ACP-007A
Micrometers³ Outside	Up to 36 in	(33 + 10L) μin	Method: ACP-016 Gage blocks & rod standards
	(37 to 60) in	(360 + 21L) μin
Inside	Up to 40 in	(51 + 1.4L) μin	Universal measuring machine, Pratt & Whitney 1000M
Depth	Up to 12 in	60 μin	Gage blocks
Laser Micrometers	Up to 2 in	39 μin	Plug gages
Parallels	Up to 30 in	45 μin	Surface plate LVDT indicator
Pin Gages³	(0.011 to 1) in	(19 + 2D) μin	Method: ACP-019; universal measuring machine, DMS 680
	(0.011 to 1) in	56 μin	Micrometer
Surface Roughness Standards	(15 to 150) μin Ra	1.7 μin	Verification of specimens per ASME B46.1
Profilometers	17 μin Ra; 119 μin Ra	1.5 μin	Method: ACP-021; roughness specimen
Clinometers & Inclinometers, & Electronic Levels	Up to 90°	0.075°	Sine plate/gage blocks
Levels (Spirit, Bubble, Machinist)³	Up to 15 in	400 μin	Surface plate & gage blocks
Rules & Tapes³	Up to 100 ft	0.04 in	Method: ACP-046; steel rule/optical scale
Optical Comparators & Measuring Machines³ Axis Linearity	Up to 12 in	80 μin	Method: ACP-018 Master calibration artifact
Magnification	5x	440 μin	Magnification checker scale
	10x	440 μin
	20x	440 μin
	50x	440 μin
	100x	440 μin
Angularity	Up to 360°	0’65’’	Sine bar & gage blocks or angle blocks

Notes from the A2LA scope:

² CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
³ Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
⁴ Percentages are percentage of reading unless otherwise indicated. L = nominal length in inches, D = nominal diameter in inches, I.V. = Indicated Value.

Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.

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See our Entire Scope of Accreditation:

Certificate Number: 1848.01

1 This laboratory offers commercial calibration & field calibration services.

2 Calibration & Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device & to influences from the circumstances of the specific calibration.

3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration & for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered & this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.

4 In the statement of CMC, percentages are percentage of reading, unless otherwise indicated, L is the numerical value of the nominal length of the device measured in inches, R is the numerical value of the resolution of the device in microinches, D is the numerical value of the nominal diameter of the device measured in inches, I.V. represents “Indicated Value”, & Ra is the numerical value of the nominal roughness of the surface measured in micrometers roughness.

5 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a fraction/percentage of the reading plus a fixed floor specification.

6 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.

7 This scope meets A2LA’s P112 Flexible Scope Policy.

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