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Electrical Calibration MachineSCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994

 

All American Scales & Calibration can calibrate multimeters (DDM, handheld, bench), process calibrators, and more. In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to our laboratory to perform the following Electrical calibrations for DC Voltage, DC Current, Resistance, Electrical Calibration of RTD Indicators and Indicating System, Electrical Calibration of Thermocouple Indicators and Indicating Systems, AC Voltage, and AC Current. 

Full details are listed below. You can also search all of our accredited calibrations or learn more about our in-lab calibration service.

 

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A2LA Accredited Calibration Lab – ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994
Certificate No. 1848.01 · Valid to August 31, 2027
Download Full Scope of Accreditation (PDF) Search all accredited calibrations »

Electrical – DC/Low Frequency Calibration Scope Includes:

 
Parameter/Equipment Range CMC2, 4, 5 (±) Comments
DC Voltage – Generate3 (0 to 330) mV 27 μV/V + 1 μV Method: ACP-070; Fluke 5522A
  330 mV to 3.3 V 4 μV/V + 2 μV  
  (3.3 to 33) V 15 μV/V + 20 μV  
  (3 to 330) V 22 μV/V + 150 μV  
  (330 to 1000) V 23 μV/V + 1.5 mV  
DC Voltage – Measure3 (0 to 100) mV 12 μV/V + 0.2 μV Method: ACP-070; Fluke 8588A
  100 mV to 1 V 2 μV/V + 0.3 μV  
  (1 to 10) V 2 μV/V + 0.5 μV  
  (10 to 100) V 7 μV/V + 30 μV  
  (100 to 1000) V 19 μV/V + 5 mV  
  (1000 to 150 000) V 1.2 mV/V + 12 μV Ross VD150 Voltage Divider, Keithley DMM7510
DC Current – Generate3 (0 to 330) μA 170 μA/A + 0.02 μA Method: ACP-070; Fluke 5522A
  330 μA to 3.3 mA 130 μA/A + 0.05 μA  
  (3.3 to 33) mA 120 μA/A + 0.25 μA  
  (33 to 330) mA 120 μA/A + 2.5 μA  
  330 mA to 1 A 230 μA/A + 40 μA  
  (1 to 3) A 430 μA/A + 40 μA  
  (3 to 10) A 510 μA/A + 500 μA  
  (10 to 20) A 1.2 mA/A + 750 μA  
Non-Toroidal Type (10 to 1000) A 0.8 % Fluke 5522A plus coil, clamp-on only
DC Current – Measure3 (0 to 10) μA 9 μA/A + 0.4 nA Method: ACP-070; Fluke 8588A
  (10 to 100) μA 18 μA/A + 1 nA  
  100 μA to 1 mA 16 μA/A + 4 nA  
  (1 to 10) mA 17 μA/A + 40 nA  
  (10 to 100) mA 57 μA/A + 1 μA  
  100 mA to 1 A 300 μA/A + 100 μA  
  (1 to 10) A 270 μA/A + 0.4 μA  
  (10 to 100) A 3 mA/A + 1 μA Keithley DMM7510 with Empro shunts
  (100 to 1000) A 3 mA/A + 1 μA  
Resistance – Generate3 (0 to 11) Ω 0.005 % + 1 mΩ Method: ACP-070; Fluke 5522A
  (11 to 33) Ω 0.004 % + 1.5 mΩ  
  (33 to 110) Ω 0.004 % + 1.4 mΩ  
  (110 to 330) Ω 0.033 % + 2 mΩ  
  330 Ω to 1.1 kΩ 0.004 % + 20 mΩ  
  (1.1 to 3.3) kΩ 0.004 % + 20 mΩ  
  (3.3 to 11) kΩ 0.004 % + 20 mΩ  
  (11 to 33) kΩ 0.004 % + 0.2 Ω  
  (33 to 110) kΩ 0.004 % + 0.2 Ω  
  (110 to 330) kΩ 0.004 % + 2 Ω  
  330 kΩ to 1.1 MΩ 0.011 % + 2 Ω  
  (1.1 to 3.3) MΩ 0.015 % + 30 Ω  
  (3.3 to 11) MΩ 0.041 % + 50 Ω  
  (11 to 33) MΩ 0.056 % + 2500 Ω  
  (33 to 110) MΩ 0.07 % + 3 kΩ  
  (110 to 330) MΩ 0.38 % + 100 kΩ  
  (330 to 1100) MΩ 1.8 % + 500 kΩ  
Resistance – Measure3 (0 to 1) Ω 0.003 % + 4 μΩ Method: ACP-070; Fluke 8588A
  (1 to 10) Ω 0.002 % + 0.02 mΩ  
  (10 to 100) Ω 0.002 % + 0.05 mΩ  
  100 Ω to 1 kΩ 0.002 % + 0.5 mΩ  
  (1 to 10) kΩ 0.002 % + 5 mΩ  
  (10 to 100) kΩ 0.002 % + 50 mΩ  
  100 kΩ to 1 MΩ 0.002 % + 1 Ω  
  (1 to 10) MΩ 0.02 % + 100 Ω  
  (10 to 100) MΩ 0.03 % + 10 kΩ  
  100 MΩ to 1 GΩ 0.3 % + 1 MΩ  
Electrical Calibration of RTD Indicators & Indicating System – Generate Simulation3
Pt 385, 100 Ω		 (-200 to 800) °C 0.08 °C Method: ACP-070; Fluke 5522A
Electrical Calibration of RTD Indicators & Indicating System – Measure Simulation3
Pt 385, 100 Ω		 (-200 to 800) °C 0.08 °C Method: ACP-070; Keithley DMM7510
Electrical Calibration of Thermocouple Indicators & Indicating Systems3
Type B		 (600 to 800) °C 0.44 °C Method: ACP-070; Fluke 5522A
  (800 to 1000) °C 0.35 °C  
  (1000 to 1550) °C 0.34 °C  
  (1500 to 1820) °C 0.34 °C  
Type E (-250 to 1000) °C 0.24 °C  
Type J (-210 to -100) °C 0.31 °C  
  (-100 to 760) °C 0.16 °C  
  (760 to 1200) °C 0.27 °C  
Type K (-200 to 100) °C 0.38 °C  
  (-100 to 120) °C 0.19 °C  
  (120 to 1000) °C 0.30 °C  
  (1000 to 1372) °C 0.46 °C  
Type N (-200 to 1300) °C 0.31 °C  
Type R (0 to 1767) °C 0.65 °C  
Type S (0 to 1767) °C 0.54 °C  
Type T (-250 to 400) °C 0.72 °C  
  (-150 to 400) °C 0.16 °C  
Parameter/Range Frequency CMC2, 4, 5 (±) Comments
AC Voltage – Generate3
(1 to 33) mV		 (10 to 45) Hz 0.018 % + 6 μV Method: ACP-070; Fluke 5522A
  45 Hz to 10 kHz 0.018 % + 6 μV  
  (10 to 20) kHz 0.025 % + 6 μV  
  (20 to 50) kHz 0.12 % + 6 μV  
  (50 to 100) kHz 0.4 % + 12 μV  
  (100 to 500) kHz 0.91 % + 50 μV  
(33 to 330) mV (10 to 45) Hz 0.034 % + 8 μV  
  45 Hz to 10 kHz 0.017 % + 8 μV  
  (10 to 20) kHz 0.019 % + 8 μV  
  (20 to 50) kHz 0.04 % + 8 μV  
  (50 to 100) kHz 0.091 % + 32 μV  
  (100 to 500) kHz 0.23 % + 70 μV  
330 mV to 3.3 V (10 to 45) Hz 0.02 % + 60 μV  
  45 Hz to 10 kHz 0.02 % + 60 μV  
  (10 to 20) kHz 0.035 % + 50 μV  
  (20 to 50) kHz 0.08 % + 50 μV  
  (50 to 100) kHz 0.28 % + 600 μV  
  (100 to 500) kHz 0.28 % + 600 μV  
(3.3 to 33) V 45 Hz to 1 kHz 0.018 % + 600 μV  
  (1 to 10) kHz 0.018 % + 600 μV  
  (10 to 20) kHz 0.03 % + 600 μV  
  (20 to 50) kHz 0.04 % + 600 μV  
  (50 to 100) kHz 0.11 % + 1.6 mV  
(33 to 330) V 45 Hz to 1 kHz 0.022 % + 2 mV  
  (1 to 10) kHz 0.017 % + 8 μV  
  (10 to 20) kHz 0.029 % + 6 mV  
  (20 to 50) kHz 0.036 % + 6 mV  
  (50 to 100) kHz 0.23 % + 50 mV  
(330 to 1000) V 45 Hz to 1 kHz 0.035 % + 10 mV  
  (1 to 5) kHz 0.03 % + 10 mV  
  (5 to 10) kHz 0.035 % + 10 mV  
AC Voltage – Measure3
(0 to 10) mV		 1 Hz to 10 Hz 0.6 % + 2 μV Method: ACP-070; Fluke 8588A
  10 Hz to 2 kHz 0.06 % + 2 μV  
  (2 to 10) kHz 0.06 % + 2 μV  
  (10 to 30) kHz 0.07 % + 2 μV  
  (30 to 100) kHz 0.45 % + 2 μV  
  (100 to 300) kHz 1.40 % + 4 μV  
  (300 to 500) kHz 3.4 % + 4 μV  
(10 to 100) mV 1 Hz to 10 Hz 0.011 % + 0.5 μV  
  10 Hz to 2 kHz 0.011 % + 0.5 μV  
  (2 to 10) kHz 0.02 % + 0.5 μV  
  (10 to 30) kHz 0.03 % + 1 μV  
  (30 to 100) kHz 0.08 % + 5 μV  
  (100 to 300) kHz 0.3 % + 30 μV  
  (300 to 500) kHz 1.5 % + 0.1 mV  
100 mV to 1 V 1 Hz to 10 Hz 0.01 % + 5 μV  
  10 Hz to 2 kHz 0.01 % + 5 μV  
  (2 to 10) kHz 0.015 % + 5 μV  
  (10 to 30) kHz 0.03 % + 5 μV  
  (30 to 100) kHz 0.08 % + 50 μV  
  (100 to 300) kHz 0.31 % + 0.3 mV  
  (300 to 500) kHz 1.5 % + 1 mV  
(1 to 10) V 1 Hz to 10 Hz 0.01 % + 50 μV  
  10 Hz to 2 kHz 0.01 % + 50 μV  
  (2 to 10) kHz 0.015 % + 50 μV  
  (10 to 30) kHz 0.03 % + 100 μV  
  (30 to 100) kHz 0.08 % + 500 μV  
  (100 to 300) kHz 0.31 % + 3 mV  
  (300 to 500) kHz 1.40 % + 10 mV  
(10 to 100) V 1 Hz to 10 Hz 0.01 % + 500 μV  
  10 Hz to 2 kHz 0.01 % + 500 μV  
  (2 to 10) kHz 0.013 % + 500 μV  
  (10 to 30) kHz 0.03 % + 1 mV  
  (30 to 100) kHz 0.08 % + 5 mV  
  (100 to 300) kHz 0.16 % + 50 mV  
(100 to 1000) V 1 Hz to 50 Hz 0.02 % + 10 mV  
  50 Hz to 2 kHz 0.02 % + 25 mV  
  (2 to 10) kHz 0.02 % + 25 mV  
  (10 to 30) kHz 0.031 % + 25 mV  
  (30 to 100) kHz 0.05 % + 25 mV  
(1000 to 100 000) V (50 to 1) kHz 6 mV/V + 3 mV Ross VD150 Voltage Divider, Keithley DMM7510
AC Current – Generate3
(29 to 330) μA		 10 Hz to 30 kHz 0.15 % + 0.1 μA Method: ACP-070; Fluke 5522A
330 μA to 3.3 mA   0.12 % + 0.15 μA  
(3.3 to 33) mA   0.042 % + 2 μA  
(33 to 330) mA   0.047 % + 20 μA  
330 mA to 1 A 5 Hz to 10 Hz 0.21 % + 100 μA  
  10 Hz to 1 kHz 0.06 % + 100 μA  
  1 kHz to 10 kHz 2.9 % + 5 mA  
330 mA to 3 A 50 Hz to 1 kHz 0.074 % + 100 μA  
  1 kHz to 5 kHz 0.7 % + 1 mA  
(2 to 20) A 1 Hz to 5 kHz 0.18 % + 5 mA  
Up to 10 A 60 Hz to 440 Hz 1.3 % Fluke 5522A plus coil, clamp-on only
(10 to 300) A 60 Hz to 440 Hz 1.0 %  
(300 to 1000) A 60 Hz 0.4 %  
AC Current – Measure3
(5 to 100) μA		 40 Hz to 5 kHz 0.07 % + 300 nA Method: ACP-070; Keithley DMM7510
  (5 to 10) kHz 0.11 % + 300 nA  
100 μA to 1 mA 40 Hz to 10 kHz 0.15 % + 300 nA  
(1 to 10) mA 40 Hz to 10 kHz 0.11 % + 3 μA  
(10 to 100) mA 40 Hz to 10 kHz 0.11 % + 30 μA  
100 mA to 1 A 40 Hz to 10 kHz 1.1 % + 400 μA  
  (5 to 10) kHz 2.3 % + 400 μA  
(1 to 3) A 40 Hz to 5 kHz 1 % + 1.5 mA  
  (5 to 10) kHz 2.3 % + 1.5 mA  
(3 to 10) A 40 Hz to 5 kHz 1 % + 5 mA  
  (5 to 10) kHz 2.3 % + 5 mA  

Notes from the A2LA scope:

  • 2 CMC (Calibration & Measurement Capability) is the smallest uncertainty the lab can achieve within its scope for routine calibrations of nearly ideal equipment, expressed at approximately 95 % confidence (k = 2). The actual uncertainty of a specific calibration may be larger depending on the customer’s device and conditions.
  • 3 Field (on-site) calibration service is available for this calibration. Uncertainties achievable at a customer’s site are normally expected to be larger than the CMC listed.
  • 4 Percentages are percentage of reading unless otherwise indicated. L = nominal length in inches, D = nominal diameter in inches, I.V. = Indicated Value.
  • 5 Measured values are determined using the instrument listed in Comments. CMCs are expressed as a value covering the full range, or as a percentage of reading plus a fixed floor.

Source: A2LA Scope of Accreditation, Certificate No. 1848.01 (Revised 09/11/2025). The official PDF is the controlling document.

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A2LA Accredited Lab 

Certificate Number: 1848.01

1 This laboratory offers commercial calibration & field calibration services.

2 Calibration & Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device & to influences from the circumstances of the specific calibration.

3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration & for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered & this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.

4 In the statement of CMC, percentages are percentage of reading, unless otherwise indicated, L is the numerical value of the nominal length of the device measured in inches, R is the numerical value of the resolution of the device in microinches, D is the numerical value of the nominal diameter of the device measured in inches, I.V. represents “Indicated Value”, & Ra is the numerical value of the nominal roughness of the surface measured in micrometers roughness.

5 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a fraction/percentage of the reading plus a fixed floor specification.

6 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.

7 This scope meets A2LA’s P112 Flexible Scope Policy.

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